The mind contains the seeds of its own awakening--seeds that we can cultivate to bring forth the fruits of a life lived consciously. With Mindfulness, Joseph Goldstein shares the wisdom of his four decades of teaching and practice in a book that will serve as a lifelong companion for anyone committed to mindful living and the realization of inner freedom. Goldstein's source teaching is the Satipa hana Sutta, the Buddha's legendary discourse on the four foundations of mindfulness that became the basis for the many types of Vipassana (or insight meditation) found today. Exquisite in detail yet wholly accessible and relevant for the modern student, Mindfulness takes us through a profound study of:

- Mindfulness of body, including the breath, postures, activities, and physical characteristics
- Mindfulness of feelings--how the experience of our sense perceptions influences our inner and outer worlds
- Mindfulness of mind--learning to recognize skillful and unskillful states of mind and thought
- Mindfulness of dhammas (or categories of experience), including the Five Hindrances, the Six Sense Spheres, and the Seven Factors of Awakening

There is a wealth of meaning and nuance in the experience of mindfulness that can enrich our lives in unimagined ways, writes Goldstein. In Mindfulness you have the tools to mine these riches for yourself.

The fruit of some thirty years' experience leading Buddhist meditation retreats, this book touches on a wide range of topics in short sections that can be either read in sequence or browsed through at leisure. Leading meditation teacher Joseph Goldstein offers favorite Dharma stories, key teachings, and answers to most-asked questions, providing an overview of Buddhist practice and its context generally while focusing on vipassana meditation specifically. He covers what the path itself is composed of, how to practice, what freeing the mind is all about, how karma works, the connection between psychology and dharma practice, a look at what selflessness really is, and how to really be of benefit to others.

One of America's most respected Buddhist teachers distills a lifetime of practice and teaching in this groundbreaking exploration of the new Buddhist tradition taking root on American soil.

A clear and personal presentation of the central teachings and practices of insight meditation from renowned authors Jack Kornfield and Joseph Goldstein.

The path of insight meditation is a journey of understanding our bodies, our minds, and our lives--of seeing clearly the true nature of experience. Joseph Goldstein and Jack Kornfield, cofounders of the Insight Meditation Society, join forces to present this accessible and easily readable guide to developing the openness and compassion that are at the heart of this spiritual practice. For those already treading the path, as well as those just starting out, this book will be a welcome companion along the way. Useful exercises are presented alongside the teachings to help readers deepen their understanding of the subjects. Among the topics covered are:

• The hindrances to meditation--ranging from doubt and fear to painful knees--and skillful means of overcoming them
• How compassion can arise in response to the suffering we see in our own lives and in the world
• How to integrate a life of responsible action and service with a meditative life based on nonattachment

This modern spiritual classic, presented as a thirty-day meditation retreat taught by Joseph Goldstein, offers timeless practical instructions and real-world advice for practicing meditation--whether walking or sitting in formal practice or engaging in everyday life. Goldstein--a beloved and respected meditation teacher who studied for many years under the guidance of eminent Buddhist teachers from India, Tibet, and Burma--uses the retreat format to explain various basic Buddhist teachings including karma, selflessness, and the four noble truths, while also drawing connections to many different spiritual traditions. With a new preface reflecting on how the conversation around meditation has changed over the last forty years, this book is the perfect companion for both experienced practitioners and those looking to get into meditation for the first time.

In The Best Interests of the Child, published between 1973 and 1986, the authors speak in one voice in concluding that the continuity of care - continuity of a child's relationship with his or her adult caregiver - is a universal essential to the child's well-being.

The authors stress that minimizing intrusions by the law is paramount to safeguarding the child's growth and development. The least detrimental alternative - the authors overarching guideline for assuring the continuity of the psychological parent-child relationship - has been cited in more than a thousand child custody cases since 1973.

In this book a teacher of insight meditation offers personal testament, healing words, and wise instruction to help meet the suffering that comes with catastrophic life events. Speaking openly about his own struggles with memories of childhood sexual abuse and with the HIV diagnosis he received in 1989, Gavin Harrison reveals how compassion offers refuge and help for all who suffer from similar crises of body, heart, and spirit. Among the topics covered are:

- Dealing with fear, anger, and self-hatred
- Working with difficult relationships
- Confronting physical pain and the fear of death
- Transforming the legacy of sexual abuse
- The question of karma and Why me?
- Grappling with issues of faith, freedom, hope, and miracles
- Basic insight meditation instructions, plus guided meditations for forgiveness, compassion, and equanimity

An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The text has been used in educating over 3,000 students at the Lehigh SEM short course as well as thousands of undergraduate and graduate students at universities across the globe. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens.

This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter- actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru- ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.

This selection of readings intends to discuss notable literature surrounding the world of criminal law, including the impact of the United States Supreme Court and the development of the codification movement.

Crime Law and Society works to takes readers into the literature of the purposes of criminal law, its processes, and the interrelation of purpose and process.

The editors of these selections strive to emphasis the research and writings that have caught their attention in order to promote discourse and discussion among professionals and general readers.

The second volume in a classic trilogy of works by Joseph Goldstein, former Sterling Professor Emeritus of Law at Yale Law School; Albert J. Solnit, the former director of the Yale Child Study Center, and Anna Freud, daughter of Sigmund Freud. These texts (Beyond the Best Interests of the Child was the first in the series, and In the Best Interests of the Child was the third) are classic references often cited in child custody cases; Before the Best Interests of the Child specifically addresses when the state should intervene. Rather than the familiar legal best interests of the child doctrine, the authors's work is based on the more realistic standard of finding the least detrimental alternative. This is indispensable reading for social workers, family court judges, lawyers, psychologists, and parents.

Beyond the Best Interests of the Child is the first volume in a classic trilogy of works by Joseph Goldstein, former Sterling Professor Emeritus of Law at Yale Law School; Albert J. Solnit, the former director of the Yale Child Study Center, and Anna Freud, daughter of Sigmund Freud.

This collection of texts are classic references often cited in child custody cases. Rather than the familiar legal best interests of the child doctrine, the authors' work is based on the more realistic standard of finding the least detrimental alternative. This is indispensable reading for social workers, family court judges, lawyers, psychologists, and parents.

An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The text has been used in educating over 3,000 students at the Lehigh SEM short course as well as thousands of undergraduate and graduate students at universities across the globe. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens.

Originally published in 1952, The Government of British Trade Unions analyses the government, in theory and in practice, of one of Britain's most important labour organizations - The Transport and General Works Union in the first half of the 20th Century. It is an appraisal of the role of the rank and file within this union of over one million members, to determine both the opportunity for, and the extent of their participation in, this State within a State. Original sources and materials, which had not previously been made public in relation to any major British or American Trade Union, were used to ascertain member turnover, participation in elections, attendance at Branch meetings and the effect of the repeal of the Trade Disputes Act on Labour Party membership. The study is of great interest both for the light it throws on the general question of Trade Unions in the modern State, and for its analysis of the Transport and General Works Union itself.

From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrometry (WDS), which utilizes crystal diffraction, and energy dispersive spectrometry (EDS), in which the x-ray quantum energy is measured directly. In general, WDS offers much better peak separation for complex line spectra, whereas EDS gives a higher collection efficiency and is easier and cheaper to use. Both techniques have undergone major transformations since those early days, from the simple focusing spectrometerand gas proportional counter of the 1950s to the advanced semiconductor detectors and programmable spectrometersoftoday. Becauseofthesedevelopments, thecapabilities and relative merits of EDS and WDS techniques have been a recurring feature of microprobeconferences for nearly40 years, and this volume bringstogetherthepapers presented at the Chuck Fiori Memorial Symposium, held at the Microbeam Analysis Society Meeting of 1993. Several themes are apparent in this rich and authoritative collection of papers, which have both a historical and an up-to-the-minute dimension. Light element analysis has long been a goal of microprobe analysts since Ray Dolby first detected K radiation with a gas proportional counter in 1960. WDS techniques (using carbon lead stearate films) were not used for this purpose until four years later. Now synthetic multilayers provide the best dispersive elements for quantitative light element analy- sis-still used in conjunction with a gas counter.

In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara- interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.

Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the physics of the processes and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.

In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High- resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop- ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the phi rho z [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of dot mapping to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities.

Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the physics of the processes and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.

From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrometry (WDS), which utilizes crystal diffraction, and energy dispersive spectrometry (EDS), in which the x-ray quantum energy is measured directly. In general, WDS offers much better peak separation for complex line spectra, whereas EDS gives a higher collection efficiency and is easier and cheaper to use. Both techniques have undergone major transformations since those early days, from the simple focusing spectrometerand gas proportional counter of the 1950s to the advanced semiconductor detectors and programmable spectrometersoftoday. Becauseofthesedevelopments, thecapabilities and relative merits of EDS and WDS techniques have been a recurring feature of microprobeconferences for nearly40 years, and this volume bringstogetherthepapers presented at the Chuck Fiori Memorial Symposium, held at the Microbeam Analysis Society Meeting of 1993. Several themes are apparent in this rich and authoritative collection of papers, which have both a historical and an up-to-the-minute dimension. Light element analysis has long been a goal of microprobe analysts since Ray Dolby first detected K radiation with a gas proportional counter in 1960. WDS techniques (using carbon lead stearate films) were not used for this purpose until four years later. Now synthetic multilayers provide the best dispersive elements for quantitative light element analy- sis-still used in conjunction with a gas counter.